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New PDF release: Application of wavelength dispersive X-ray spectroscopy in

By Matjaž Kavčič

ISBN-10: 9533079673

ISBN-13: 9789533079677

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Extra resources for Application of wavelength dispersive X-ray spectroscopy in X-ray trace element analytical techniques

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202, No. 10, pp. 2015–2022, ISSN 0257-8972. Geoffrey C. Allen, Michael T. Curtis, Alan J. Hooper & Philip M. Tucker. (1973). X-Ray photoelectron spectroscopy of chromium–oxygen systems, Journal of the Chemical Society, Dalton Transactions, No. 16, pp. 1675-1683, ISSN 1477-9226. Hironobu Miya, Manabu Izumi, Shinobu Konagata & Takayuki Takahagi. (2003). Analysis of chemical structures of ultrathin oxynitride films by X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry, Japanese Journal of Applied Physics, Vol.

A Practical Application of X-Ray Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films 27 The XPS survey spectrum for TiAl/TiAlN films is shown in Fig. 5. 9 eV correspond to O1s, Ti2p, Ti2p1/2, N1s and Al2p3/2 binding energies, respectively. 499. Fig. 5. XPS survey spectrum of Ti-Al-N coatings deposited on Si (100). , 2003), when the peaks are fitted from experimental results, it is necessary to adjust first the N energy band because it is the element that provides greater reliability for XPS, then, take this first adjust as base, the other peaks related to the remaining elements are adjusted.

TiN coatings on mild steel substrates with electroless nickel as an interlayer. Surface & Coatings Technology, Vol. 48, No. 2, pp. 163-168, ISSN 02578972. Cheng, Y. ; Tay, B. ; Lau S. P. & Shi X. (2001). Influence of substrate bias on the structure and properties of (Ti, Al)N films deposited by filtered cathodic vacuum arc. Journal of Vacuum Science & Technology A, Vol. 19, No. 3, pp. 736-743, ISSN 0734-2101. ; Yarwood, J. -D. (1999). Raman microscopic studies of PVD hard coatings, Surface & Coatings Technology, Vol.

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Application of wavelength dispersive X-ray spectroscopy in X-ray trace element analytical techniques by Matjaž Kavčič


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